高压对γ能谱测量形状的影响(含答辩问题)

高压对γ能谱测量形状的影响(含答辩问题)(选题表,开题报告,中期报告,论文10000字)
Effects of high voltage on the shape of the γ-ray Spectrometry
摘  要
在γ能谱测量研究过程中，能谱仪一般会进行长时间的工作，由于各种因素的影响如高压变化、温度、元器件的质量等，γ能谱谱线也会受到影响。本文主要研究的是高压对γ能谱测量形状的影响，当γ能谱测量仪在高压变化的影响下，测量中会出现谱线的漂移，即同一能量的γ射线在不同高压下测量，谱线上峰的位置所在道数会出现偏移变化。本文先简单地介绍NaI（Tl）闪烁体γ能谱仪系统，然后以NaI（Tl）闪烁体γ能谱仪作为实验工具，通过改变输入的高压，得到不同高压作用下铯137的γ能谱，从而进行分析对比，得出高压对γ能谱形状的影响。

关键词：γ能谱测量；NaI（Tl）闪烁体；高压；能谱形状

ABSTRACT
In the course of the study γ-ray spectrometry, the energy dispersive spectroscopy will generally work for a long time. Due to various factors, such as the high voltage changes, the temperature and the quality of components, γ spectrum lines will be affected. This paper is mainly a study about the effects of high voltage on the shape of the γ-ray spectrometry. When the energy dispersive spectroscopy works under the influence of high voltage changes, the measurement will appear in the spectrum, that the spectrum line will drift. It means that the peak position will change from the original channel to another channel. This paper first introduces the NaI (Tl) scintillator γ spectrometry system, and then use NaI (Tl) scintillator γ spectrometry system as an experimental tool, to change the input of high voltage, to get the Cs137 γ-ray spectrums of different high voltage .Finally through a series of Analysis and comparison，we can know about the effects of high voltage on the shape of the γ-ray spectrometry.

KEYWORDS: γ-ray spectrometry；NaI (Tl) scintillator；high voltage；
shape of the γ-ray Spectrometry

目  录
摘  要    I
ABSTRACT    II
1    引言    1
2    NaI（Tl）闪烁体γ能谱仪系统    2
2.1    γ射线的探测原理    2
2.1.1    光电效应    2
2.1.2    康普顿效应    3
2.1.3    电子对效应    4
2.2  NaI（Tl）闪烁体γ能谱仪系统介绍    4
3    铯137的γ射线能谱    5
4    高压对γ能谱测量形状的影响    6
4.1    高压对光电倍增管的直接影响    7
4.2    实验具体操作步骤    8
4.3    多道脉冲幅度分析器介绍    8
4.4    实验结果分析    9
5    结论    13
鸣  谢    14
参考文献    15
附  录    16